Showing results: 631 - 645 of 1675 items found.
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85130G -
Keysight Technologies
The Keysight 85130G test port adapter protects the test set port from connecting directly with the device under test. It has a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a NMD-2.4 mm (f) to NMD-2.4 mm (m) adapter and a NMD-2.4 mm (f) to PSC-2.4 mm (f) adapter. The frequency range for these adapters is dc to 50 GHz with a return loss of 23 dB or better.
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85130C -
Keysight Technologies
The Keysight 85130C test port adapter is designed to protect the test set port when it would be directly connected to the device under test. These adapters have a special rugged female connector designed for connecting to the network analyzer test port. This special connector will not mate with a standard male connector, but converts the rugged test set port to a connection that can be mated with the device under test. The set contains a 3.5 mm to type-N male adapter and a 3.5 mm to type-N female adapter. The frequency range for these adapters is dc to 18 GHz with a return loss of 28 dB or better.
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85130D -
Keysight Technologies
The Keysight 85130D test port adapter protects the test set port from being directly connected to the device under test. These adapters have a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a 3.5 mm to PSC-3.5 mm male adapter and a 3.5 mm to PSC-3.5 mm female adapter. The frequency range for these adapters is dc to 26.5 GHz with a return loss of 28 dB or better.
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85130H -
Keysight Technologies
The Keysight 85130H test port adapter protects the test set port from being directly connected to the device under test. This adapter has a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a 1.85 mm to 1.85 mm male adapter and a 1.85 mm to 1.85 mm female adapter. The frequency range for these adapters is dc to 67 GHz with a return loss of 23 dB or better.
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85130F -
Keysight Technologies
The Keysight 85130F test port adapter protects the test set port from connecting directly with the device under test. It has a special rugged female connector designed for connecting to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. The set contains a 2.4 mm to PSC-3.5 mm male adapter and a 2.4 mm to PSC-3.5 mm female adapter. The frequency range for these adapters is dc to 26.5 GHz with a return loss of 26 dB or better.
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Chroma ATE Inc.
As the automotive industry advances power conversion and battery technologies, Chroma has been actively working to improve electric vehicle (EV) testing performance and cost by developing flexible automated power conversion test platforms and regenerative battery test systems. Chroma ATE is a world leading manufacturer of precision test and measurement instrumentation, automated test systems, intelligent manufacturing systems, and turnkey test and automation solutions. Chroma’s Automated Test Systems for Electric and Hybrid Electric Vehicles consist of standard test platforms that are combined into one expandable test system that can test most power components in an EV’s power system. Compared to specialized test equipment developed for a single EV model or application, Chroma’s systems provide greater flexibility.
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UNH IOL
We have been a leader and expert in NVMe Testing Services for several years providing conformance and interoperability testing. In addition, we also host NVMe Plugfests where storage vendors from around the world come together to test against NVMe standards to qualify them for the NVMe Integrator's List. The NVMe Integrator's List currently consists of configurations that have proven to be interoperable and conformant to NVMe standards.
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KCTS-8000 -
Knopp Incorporated
The Knopp Current Transformer Testing System (Type KCTS-8000) is designed to measure the accuracy of instrument transformers having 1 or 5 ampere secondaries and primaries of up to 8000 amperes. The system uses a high accuracy multi-range current transformer as a reference standard. All ANSI standard burdens are included. The phase angle and ratio errors of the transformer-under-test (TUT) are measured by the built-in Knopp Automatic Transformer Comparator.
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KCTS-8000 -
The Eastern Specialty Company
The Knopp Current Transformer Testing System (Type KCTS-8000) is designed to measure the accuracy of instrument transformers having 1 or 5 ampere secondaries and primaries of up to 8000 amperes. The system uses a high accuracy multi-range current transformer as a reference standard. All ANSI standard burdens are included. The phase angle and ratio errors of the transformer-under-test (TUT) are measured by the built-in Knopp Automatic Transformer Comparator.
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A10-M -
Quartzlock (UK) Ltd.
Frequency Referencing, Calibration, Standards Lab, Production Test for Oscillator Manufacturers. A very high stability LOW NOISE 10MHz Rubidium Reference, primarily for production test of quartz oscillators and RF instrumentation frequency referencing. This industry standard 2U rack-mount instrument has a long heritage and ongoing production life for this latest 2009 version that features RS232 monitoring and control of the DPLL, locking the Ultra Low Noise OCXO to the Rubidium. Damping and Bandwidth is controlled by integrator digital gain, proportional digital gain, pre-filter order and subsample rate. Eight values of user selected bandwidth are available.
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National Technical Systems
Forced entry testing is conducted on building envelope and system components such as doors, windows, wall panels and escape hatches as an attempt to penetrate or distort an edge in order to disengage a fitting or device from its mountings and allow access. The US Department of State has developed a standard that all building envelope and system components used in both domestic security and overseas facilities are required to achieve. NTS conducts all forced entry test in their DOS approved facility in accordance to the SD-STD-01.01 standard. All testing is witnessed by DOS personnel with NTS providing reports on all tests performed.
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DisplayMate Technologies Corporation
DisplayMate Multimedia with Motion Bitmaps Edition includes a Motion Engine that moves a special set of test patterns and test photos to measure and evaluate response time, motion blur and motion artifacts in displays for different speeds, directions, intensities and colors for all monitors, projectors and HDTVs. It has everything in the standard Multimedia Edition including all of its 500+ test patterns up through 3072 x 3072 resolution.
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INN-8686-18-PRO -
INNOVENTIONS, Inc.
Your best option if you need to test a large volume of memory! The RAMCHECK LX DDR4 Pro 288-pin DIMM Adapter (p/n INN-8686-18-PRO) gives RAMCHECK LX users the power to test 288-pin DDR4 modules, including unbuffered (UDIMM), load-reduced (LR-DIMM) and registered modules (RDIMM), both ECC and non-ECC, that comply with JEDEC standards. It includes the DDR4 Series adapter and DDR4 Pro DIMM test head.
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RAMCHECK LX -
INNOVENTIONS, Inc.
USBWith the RAMCHECK LX DDR4 memory tester package (part number INN-8686-DDR4) you can quickly test and identify DDR4 DIMMs that comply with JEDEC standards. Tests are fast, reliable and easy to do. The RAMCHECK LX DDR4 package includes the RAMCHECK LX base tester and 288-pin DDR4 DIMM adapter. (This package is also available with the DDR4 DIMM Pro adapter, featuring a very rugged test socket).
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TOPTEST GmbH
TestStand from National Instruments is standard software for automated testing. Complex, variable test systems can be built here by integrating various hardware and software modules (e.g. LabVIEW VIs, C # modules). We can easily integrate created LabVIEW VIs into TestStand for a product-specific test sequence. All functions that are required for an automatic test sequence are available. Parameters can be changed in the TestStand environment. The user interface can be adapted to your needs.
